Method of testing the resistance of a circuit to a side channel analysis of second order or more
US10419206B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 22, 2017 |
| Grant date | Sep 17, 2019 |
| Priority date | — |
| Expiry date | Oct 30, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L2209/12
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A test method of a circuit, comprising, acquiring value sets including values of a physical quantity or of logic signals, linked to the activity of a circuit to be tested when the circuit executes an operation of an operation set of distinct cryptographic operations applied to a same secret data, selecting at least two subsets of values in each value set, for each value set and each value subset, counting occurrence numbers of values of the subset, for each value set, forming all possible n-tuples associating together one of the occurrence numbers of each value subset of the value set, and computing a combined occurrence number for each n-tuple of the value set, to form an occurrence number set for the value set, and analyzing the occurrence number sets to determine the part of the secret data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.