Measurement system and method to interrogate birefringent optical sensors with a frequency swept source based interrogator
US10422721B2 · kind B2 · utility
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22Claims
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Key dates
| Filing date | Mar 21, 2016 |
| Grant date | Sep 24, 2019 |
| Priority date | — |
| Expiry date | Mar 21, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S5/0687
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention provides a measurement system to interrogate at least one birefringent optical sensor and a method to interrogate birefringent optical sensors at high speed and high resolution. The system and method detects, at least, a first and a second spectral feature that are polarization dependent, wherein the detected first and second spectral features correspond to different responses of at least one birefringent optical sensor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.