Quality evaluation
US10424059B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 11, 2017 |
| Grant date | Sep 24, 2019 |
| Priority date | — |
| Expiry date | Dec 12, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30121
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Implementations of the present disclosure relate to methods, systems, and computer program products for quality evaluation. In one implementation, a computer-implemented method is disclosed. In the method, a pattern period may be extracted from an image of a target object, the pattern period indicating a period of a pattern that is repeated in the image. A reference image may be generated by repeating the pattern based on the extracted pattern period. Quality of the target object may be evaluated by comparing the generated reference image and the image of the target object. In other implementations, a computer-implemented system and a computer program product for quality evaluation are disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.