Self-testing of an analog mixed-signal circuit using pseudo-random noise
US10425068B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 14, 2018 |
| Grant date | Sep 24, 2019 |
| Priority date | — |
| Expiry date | Jun 22, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03F2203/45481
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A method embodiment includes combining a control signal of a voltage regulator circuit of an apparatus with pseudo-random noise, and using the control signal to provide an output voltage signal as attenuated by a power supply rejection ratio (PSRR) of an analog mixed-signal (AMS) circuit of the apparatus. The method further includes self-testing the AMS circuit by cross-correlating a signal indicative of the output voltage signal from the AMS circuit with the pseudo-random noise and, in response, assessing the results of the cross-correlation relative to a known threshold indicative of a performance level of the AMS circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.