Devices and methods for monitoring, in particular for regulating, a cutting process
US10427242B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 11, 2016 |
| Grant date | Oct 1, 2019 |
| Priority date | — |
| Expiry date | Aug 19, 2037 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB23K31/125
- WIPO fieldMachine tools
- WIPO sectorMechanical engineering
Abstract
The invention relates to devices and methods for monitoring or regulating a cutting process on a workpiece. A focusing element focuses a high-energy beam onto the workpiece. An image capture apparatus captures a region at the workpiece to be monitored. The region includes an interaction region of the high-energy beam with the workpiece. An evaluation apparatus determines at least one characteristic variable of the cutting process, in particular of a kerf formed during the cutting process, on the basis of the captured interaction region.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.