Patent · US Active

Test circuit, test method, array substrate and manufacturing method thereof

US10429412B2 · kind B2 · utility

0Cited by

2References

18Claims

0Family size

Assignee

BOE Technology Group Co., Ltd. · CN

Inventors

Yucheng Chan · Beijing, CN
Dong Li · Beijing, CN
Bin Zhang · Beijing, CN

Key dates

Filing date	Dec 14, 2017
Grant date	Oct 1, 2019
Priority date	—
Expiry date	Dec 29, 2037

Classification

Technology area (CPC G)Physics
CPC primaryG01R3/00
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A test circuit, a test method, an array substrate and a manufacturing method thereof are provided. The test circuit includes a plurality of to-be-tested units and plurality of test electrodes connected to the to-be-tested units. The plurality of to-be-tested units are arranged in a matrix. At least one of the test electrodes is multiplexed by the plurality of to-be-tested units in a row direction and at least one of the test electrodes is multiplexed by the plurality of to-be-tested units in a column direction.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.