Patent · US Active

Measurement device and a method of selecting operational parameters of a chip removing machining tool

US10434615B2 · kind B2 · utility

0Cited by
4References
20Claims
0Family size

Assignee

Inventor

Key dates

Filing dateNov 26, 2015
Grant dateOct 8, 2019
Priority date
Expiry dateJun 26, 2036

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01P15/18
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A measurement device for a chip removing machine, and methods of obtaining frequency response functions, obtaining stability charts and selecting operational parameters of a chip removing machining tool are disclosed. The device includes an engagement portion at the rear end for engagement with the machine and a measurement portion at the front end. The measurement portion is without a tool tip and includes a planar front end surface perpendicular to the centre axis. The front end surface has a coupling point aligned with the centre axis for receiving mechanical excitation. The front end surface further includes a plurality of seats for receiving one accelerometer each for measuring a response of the received mechanical excitation. When an accelerometer is received in one of the seats, and abutts against three contact surfaces thereof, it is positioned and oriented three dimensionally and around three axes of rotation in relation to the coupling point.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.