System and method for quantifying X-ray backscatter system performance
US10436724B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 16, 2016 |
| Grant date | Oct 8, 2019 |
| Priority date | — |
| Expiry date | Aug 18, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/631
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for quantifying x-ray backscatter system performance may include a support; a plurality of rods mounted on the support; the rods of the plurality of rods arranged parallel to each other, having generally curved outer surfaces, and being arranged in groups of varying widths, each group of the groups having at least two of the rods of a same width; and a user interface configured to be connected to receive a backscatter signal from an x-ray backscatter detector associated with an x-ray tube, apply a transfer function to generate a transfer curve representing x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.