Patent · US Active

Integrated testing and handling mechanism

US10436834B2 · kind B2 · utility

2Cited by
6References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 10, 2014
Grant dateOct 8, 2019
Priority date
Expiry dateJun 8, 2036

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2868
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An integrated testing and handler mechanism includes an input/output module including: an input section, an output section, a turret that includes a plurality of pickup heads, and a shuttle configured to move the carrier from the component loading location to a test module transfer location; and a test module including: a test head comprising an array of a plurality of test sockets, a plunger configured to plunge the components held by the carrier into the test sockets when the carrier is located on the plunger, and a rotary table that includes a plurality of grippers that rotate around the rotary table, the rotary table being configured to (i) transfer a carrier between the test module transfer location and an input/output module transfer location, (ii) rotate the carrier between the input/output module transfer location and a plunger transfer location, and (iii) transfer the carrier between the plunger transfer location and plunger.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.