Inspection systems for quarantine and methods thereof
US10436932B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Sep 28, 2016 |
| Grant date | Oct 8, 2019 |
| Priority date | — |
| Expiry date | Apr 8, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V5/224
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present disclosure discloses an inspection system for quarantine and a method thereof. The CT technology is applied to the field of quarantine supervision, overcoming a problem of objects in an image of a single-view or a multi-view X-ray machine being overlapped, as well as a problem of organics including contrabands in a conventional CT image being not highlighted, not elaborated, and having bad contrast. Accuracy and efficiency of inspecting an object by human operator for quarantine inspection can be considerably improved, which is of a high application value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.