Patent · US Active

Inspection systems for quarantine and methods thereof

US10436932B2 · kind B2 · utility

0Cited by
8References
24Claims
0Family size

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Key dates

Filing dateSep 28, 2016
Grant dateOct 8, 2019
Priority date
Expiry dateApr 8, 2037

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01V5/224
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present disclosure discloses an inspection system for quarantine and a method thereof. The CT technology is applied to the field of quarantine supervision, overcoming a problem of objects in an image of a single-view or a multi-view X-ray machine being overlapped, as well as a problem of organics including contrabands in a conventional CT image being not highlighted, not elaborated, and having bad contrast. Accuracy and efficiency of inspecting an object by human operator for quarantine inspection can be considerably improved, which is of a high application value.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.