Patent · US Active

Photoconductor charging uniformity correction

US10437169B2 · kind B2 · utility

0Cited by

5References

18Claims

0Family size

Assignee

HP INDIGO B.V. · NL

Inventors

Ran Waidman · Rehovot, IL
Sasi Moalem · Nes Ziona, IL
Kobi Shkuri · Nes Ziona, IL

Key dates

Filing date	Mar 31, 2016
Grant date	Oct 8, 2019
Priority date	—
Expiry date	Mar 31, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG03G15/5037
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Examples of charging a photoconductive layer in an image forming apparatus are described. In one example, a method includes applying a charging voltage to the photoconductive layer and measuring surface voltages of the photoconductive layer at a plurality of positions on the photoconductive layer. Based on the measured surface voltages, a correction voltage profile is determined. The determined correction voltage profile includes at least a first correction voltage associated with a first position on the photoconductive layer and a second correction voltage associated with a second position, different to the first position, on the photoconductive layer. The method includes applying the first correction voltage to the photoconductive layer and applying the second correction voltage to the photoconductive layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.