Defect reporting in application testing
US10437717B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 29, 2015 |
| Grant date | Oct 8, 2019 |
| Priority date | — |
| Expiry date | Jan 29, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3698
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present subject matter relates to defect reporting in application testing. In an implementation, a category of application testing is determined based on a testing instance of an application. The category of application testing is indicative of an aspect of the application, being tested. A list of previously reported defects associated with the determined category of application testing is displayed in a display layer over the testing instance of the application. A first user-input indicative of one of acceptance and rejection of a previously reported defect, from the list, with respect to the testing instance of the application is received. The first user-input is aggregated with previous user-inputs indicative of one of acceptance and rejection of the previously reported defect. It is determined whether the previously reported defect is irrelevant to the testing instance of the application based on the aggregation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.