Patent · US Active

Automatic optical inspection system and operating method thereof

US10438340B2 · kind B2 · utility

1Cited by

2References

12Claims

0Family size

Assignee

Test Research, Inc. · TW

Inventors

Kuang-Pu Wen · Taipei, TW
Wen-Ming Wu · Taipei, TW
Chun-Yen Huang · Taoyuan, TW

Key dates

Filing date	Oct 6, 2017
Grant date	Oct 8, 2019
Priority date	—
Expiry date	Oct 10, 2037

Classification

Technology area (CPC G)Physics
CPC primaryG06T2207/30148
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An automatic optical inspection system includes a first AOI machine and a second AOI machine, and the second AOI machine is electrically connected to the first AOI machine. The first AOI machine is configured to use a first resolution to inspect an object, so as to detect a possible defective region(s) of the object. The second AOI machine is configured to use a second resolution higher than the first resolution of the first AOI machine to inspect within the possible defective region(s) only, so as to detect whether there is/are any defect(s) within the possible defective region(s) of the object.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.