System and method for electrical characterization of electrical materials
US10444187B2 · kind B2 · utility
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3References
16Claims
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Key dates
| Filing date | Aug 30, 2017 |
| Grant date | Oct 15, 2019 |
| Priority date | — |
| Expiry date | Apr 26, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05K2201/032
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods can provide a fast and accurate way to measure conductivity and Hall effect, such that transient conductivities, transient carrier densities or transient mobilities can be measured on millisecond time scales, for example. The systems and methods can also reduce the minimum magnetic field needed to extract carrier density or mobility of a given sample, and reduce the minimum mobility that can be measured with a given magnetic field.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.