Patent · US Active

Automatic calibration and tuning of feedback systems

US10444259B2 · kind B2 · utility

0Cited by

1References

9Claims

0Family size

Assignee

Technion Research & Development Foundation Limited · IL

Inventors

Uri Sivan · Haifa, IL
Kfir Kuchuk · Rishon LeZion, IL
Itai Schlesinger · Haifa, IL

Key dates

Filing date	Aug 24, 2016
Grant date	Oct 15, 2019
Priority date	—
Expiry date	Aug 24, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG01Q60/32
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for automatically calibrating a feedback system, comprising: receiving one or more input parameters associated with a feedback system; applying the one or more input parameters to a model of the feedback system; deriving one or more feedback parameters for the feedback system from the model by: optimizing the model for the feedback parameters, and applying a noise characteristic of the feedback system to the model; and automatically tuning the feedback system using the one or more derived feedback parameters.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.