Method and system for tracking the centre of a peak from a plurality of sample points in an optical system
US10445403B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 16, 2014 |
| Grant date | Oct 15, 2019 |
| Priority date | — |
| Expiry date | Jul 18, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01D5/35319
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method of determining the center of a peak of data points of an optical sensor are disclosed. The method can comprise the steps of performing an initial setup measurement of the sample points and extracting a peak; fitting the peak with a function that uses at least one of the peak's width, amplitude and center offset as fitting parameters; producing a set of linear equations which when solved calculate the optimum fit of a function to the peak assuming the previously calculated peak's width; and performing subsequent measurements of the data points to find peaks and solving the set of linear equations to determine the center of the peaks.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.