Systems and methods for determining dielectric constant or resistivity from electromagnetic propagation measurement using contraction mapping
US10450861B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 2, 2015 |
| Grant date | Oct 22, 2019 |
| Priority date | — |
| Expiry date | Jun 1, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V3/38
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Identifying the dielectric constant and/or the electrical resistivity of part of a geological formation may reveal useful characteristics of the geological formation. This disclosure provides methods, systems, and machine-readable media to determine dielectric constant or electrical resistivity, or both, using contraction mapping. Specifically, contraction mapping may be used with a function of wavenumber k to iteratively solve for values of dielectric constant and electrical resistivity until convergence is achieved. This may allow for convergence to a solution without computing partial derivatives and/or with fewer iterations than previous techniques.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.