Patent · US Active

System and method of analyzing a curved surface

US10451407B2 · kind B2 · utility

0Cited by
21References
12Claims
0Family size

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Inventors

Key dates

Filing dateNov 23, 2015
Grant dateOct 22, 2019
Priority date
Expiry dateApr 19, 2036

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/20056
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of analyzing a curved surface is provided. The method includes obtaining a first data point set including data points representative of a distance between points along the curved surface and a reference axis, determining outlier data points in the first data point set, extracting the outlier data points from the first data point set, thereby defining a second data point set. The method also includes determining a fitted curve for the second data point set, wherein the fitted curve defines an approximate true curve of the curved surface.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.