System and method of analyzing a curved surface
US10451407B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 23, 2015 |
| Grant date | Oct 22, 2019 |
| Priority date | — |
| Expiry date | Apr 19, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20056
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of analyzing a curved surface is provided. The method includes obtaining a first data point set including data points representative of a distance between points along the curved surface and a reference axis, determining outlier data points in the first data point set, extracting the outlier data points from the first data point set, thereby defining a second data point set. The method also includes determining a fitted curve for the second data point set, wherein the fitted curve defines an approximate true curve of the curved surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.