Patent · US Active

System and method for calibrating a measuring arrangement and characterizing a measurement mount

US10451453B2 · kind B2 · utility

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9Claims

0Family size

Assignee

Rohde & Schwarz GmbH & Co. KG · DE

Inventors

Lorenz-Peter Schmidt · Prüm, DE
Marcus Schramm · Strullendorf, DE
Michael Hrobak · Bad Birnbach, DE
Jan Schür · Forchheim, DE

Key dates

Filing date	Feb 20, 2013
Grant date	Oct 22, 2019
Priority date	—
Expiry date	Mar 10, 2035

Classification

Technology area (CPC G)Physics
CPC primaryG01R35/005
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method and a system for calibrating a measuring arrangement on the basis of a 16-term error model determines a matrix (A) with measured scattering parameters (Sm) from different calibration standards (3) and with associated actual scattering parameters (Sa) of the calibration standards (3) and determines linear-in-T system errors (Ti) for the calibration of a network analyzer (1) by solving a linear equation system with the determined matrix (A). To solve the linear equation system, a first and a second linear-in-T system error (k, p) are freely selected in each case. With use of reciprocal calibration standards, the determined linear-in-T system errors are weighted with the freely selected first linear-in-T system error (Ti) or with a correct second linear-in-T system error pkor(k)) dependent upon the first linear-in-T system error (k).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.