Utilizing semantic clusters to predict software defects
US10452525B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 20, 2016 |
| Grant date | Oct 22, 2019 |
| Priority date | — |
| Expiry date | Dec 6, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method, apparatus and product for utilizing semantic clusters to predict software defects. The method comprising: obtaining a plurality of software elements that are associated with a version of a System Under Test (SUT), wherein the plurality of software elements comprise defective software elements which are associated with a defect in the version of the SUT; defining, by a processor, a plurality of clusters, wherein each cluster of the plurality of clusters comprises software elements having an attribute, wherein the attribute is associated with a functionality of the SUT; and determining a score of each cluster of the plurality of clusters, wherein the score of a cluster is based on a relation between a number of defect software elements in the cluster and a number of software elements in the cluster.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.