System and method for pattern detection and camera calibration
US10452938B2 · kind B2 · utility
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Key dates
| Filing date | Nov 14, 2017 |
| Grant date | Oct 22, 2019 |
| Priority date | — |
| Expiry date | Nov 14, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/12
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Detecting a pattern in an image by receiving the image of a pattern and storing the image in a memory, where the pattern is composed of shapes that have geometrical properties that are invariant under near projective transforms. In some embodiments the process detects shapes in the image using the geometrical properties of the shapes, determines the alignment of the various shapes, and, corresponds or matches the shapes in the image with the shapes in the pattern. This pattern detection process may be used for calibration or distortion correction in optical devices.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.