System and method for white spot mura detection
US10453366B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 30, 2017 |
| Grant date | Oct 22, 2019 |
| Priority date | — |
| Expiry date | Jan 19, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2360/145
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for detecting one or more white spot MURA defects in a display panel includes receiving an image of the display panel, the image including the one or more white spot MURA defects, dividing the image into a plurality of patches, each one of the plurality of patches corresponding to an m pixel by n pixel area of the image (wherein m and n are integers greater than or equal to one), generating a plurality of feature vectors for the plurality of patches, each of the feature vectors corresponding to one of the plurality of patches and including one or more image texture features and one or more image moment features, and classifying each one of the plurality of patches based on a respective one of the plurality of feature vectors by utilizing a multi-class support vector machine to detect the one or more white spot MURA defects.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.