Patent · US Active

Method for measuring group delay on a device under test, measurement device as well as measurement system

US10454600B2 · kind B2 · utility

7Cited by

9References

14Claims

0Family size

Assignee

Rohde & Schwarz GmbH & Co. KG · DE

Inventors

Martin Leibfritz · Aying, DE
Werner Held · Pöcking, DE

Key dates

Filing date	Apr 13, 2017
Grant date	Oct 22, 2019
Priority date	—
Expiry date	Apr 13, 2037

Classification

Technology area (CPC G)Physics
CPC primaryG01R27/28
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for measuring group delay on a device under test is described, wherein a test signal with a carrier frequency is generated. An amplitude modulation is applied to said test signal in order to generate at least two group delay signals having frequencies that are symmetrical to the frequency of said test signal. At least said group delay signals are provided to said device under test. Further, a measurement device and a measurement system are described.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.