Systems and methods for X-ray imaging
US10455678B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 29, 2017 |
| Grant date | Oct 22, 2019 |
| Priority date | — |
| Expiry date | Jul 15, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05G1/70
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A system and method for generating X-rays are disclosed. The method may include emitting an electron beam from a cathode to a focal track of a rotating target. The method may further include deflecting the electron beam onto a first region of the focal track at a first time, and deflecting the electron beam onto a second region of the focal track at a second time. The first region of the focal track may be separated from the second region of the focal track. The method may further include generating X-rays in response to the electron beam deflected onto the first region of the focal track or onto the second region of the focal track.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.