Method for treating a semiconductor device
US10456814B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 6, 2018 |
| Grant date | Oct 29, 2019 |
| Priority date | — |
| Expiry date | Nov 6, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/4148
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of treating a sensor array including a plurality of sensors and an isolation structure, where a sensor of the plurality of sensors has a sensor pad exposed at a surface of the sensor array and the isolation structure is disposed between the sensor pad and sensor pads of other sensors of the plurality of sensors, comprises exposing the sensor pad and the isolation structure to a non-aqueous organo-silicon solution including an organo-silicon compound and a first non-aqueous carrier; applying an acid solution including an organic acid and a second non-aqueous carrier to the sensor pad; and rinsing the acid solution from the sensor pad and the isolation structure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.