Estimating in situ stress from acoustic emission source parameters
US10458231B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 31, 2014 |
| Grant date | Oct 29, 2019 |
| Priority date | — |
| Expiry date | Dec 3, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V2210/65
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method can include receiving acoustic emission data for acoustic emissions originating in a formation, performing a moment tensor analysis of the data, thereby yielding acoustic emission source parameters, determining at least one acoustic emission source parameter angle having a highest number of associated acoustic emission events, and calculating an in situ stress parameter, based on the acoustic emission source parameter angle. A system can include multiple sensors that sense acoustic emissions originating in a formation, and a computer including a computer readable medium having instructions that cause a processor to perform a moment tensor analysis of the data and yield acoustic emission source parameters, determine at least one acoustic emission source parameter angle having a highest number of associated acoustic emission events, and calculate an in situ stress parameter, based on the acoustic emission source parameter angle.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.