Layer system and optical element comprising a layer system

US10459124B2 · kind B2 · utility

Assignee

• RODENSTOCK GMBH · DE

Inventors

• Rüdiger SCHERSCHLICHT · Unterhaching, DE
• Michael Vogt · Gilching, DE

Key dates

• Filing date: Oct 19, 2015
• Grant date: Oct 29, 2019
• Expiry date: Dec 3, 2035

Classification

• Technology area (CPC G): Physics
• CPC primary: G02C7/10
• WIPO field: Optics
• WIPO sector: Instruments

Abstract

A layer system includes at least one stack of successive multilayers, wherein each multilayer includes a first partial layer with a first optical thickness and a second partial layer with a second optical thickness that is different from the first optical thickness. The multilayer has optical characteristics that are specified depending on a parameter which is a function of a ratio of quotients of the optical thickness of a partial layer with higher refractive characteristics and the optical thickness of a partial layer with lower refractive characteristics of the respective multilayers, wherein the index i denotes the order of the successive multilayers in the stack. The product of a reflectivity of the stack of multilayers and the parameter is less than for an anti-reflection and/or anti-reflective effect of the stack of multilayers, or is greater than or equal to 1 for a mirroring. An optical element may include a layer system and a method for producing such a layer system.