Patent · US Active

Testing system

US10460617B2 · kind B2 · utility

1Cited by
4References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 16, 2013
Grant dateOct 29, 2019
Priority date
Expiry dateMay 9, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06Q50/01
  • WIPO fieldIT methods for management
  • WIPO sectorElectrical engineering

Abstract

A testing system includes apparatus and methods of testing a subject according to a forced-choice scheme. The scheme is based on Thurstonian Item-Response. Theory and is particularly relevant to personality assessment. The invention provides dynamic test generation and scoring for efficient testing of subjects using unique tests.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.