Dual measurement displacement sensing technique
US10466030B2 · kind B2 · utility
1Cited by
7References
8Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 12, 2017 |
| Grant date | Nov 5, 2019 |
| Priority date | — |
| Expiry date | Oct 10, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/282
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for determining a length of a span of electrically conductive material, comprising a first voltage measurement across the entire span, and a second voltage measurement across a constant-length segment of the span. The dual measurements allow the calculation of the span length in a manner that is robust to many disturbances including ambient temperature, material temperature, and material stress and fatigue.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.