Sensor device for measuring a surface
US10466040B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 25, 2017 |
| Grant date | Nov 5, 2019 |
| Priority date | — |
| Expiry date | Jun 20, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S17/08
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A sensor device (100), for measuring a surface (101), includes a lighting device (103) emitting a light beam (105); an optical device (107) splitting the light beam (105) into partial light beams (109, 111), and emitting the first partial light beam (109) toward a first surface area (113) and emitting the second partial light beam (111) toward a second surface area (115). A light sensor (117) is configured to receive a first surface area reflection (109-1) of the first partial light beam (109) and a second surface area reflection (111-1) of the second partial light beam (111). A processor (119) is configured to detect a distance of the first surface area (113) and of the second surface area (115) to the sensor device (100) based on a position of the first partial light beam reflection (109-1) and the second partial light beam reflection (111-1) on the light sensor (117).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.