Depth measurement using scanning diffractive optical elements
US10466360B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 31, 2017 |
| Grant date | Nov 5, 2019 |
| Priority date | — |
| Expiry date | Jan 12, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/56
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A depth measurement assembly (DMA) measures depth information of an object in a local area. The DMA includes structured light projector, a depth camera assembly, and a controller. The structured light projector projects structured light patterns into the local area. The structured light projector includes a diffractive optical unit that includes diffractive optical elements (DOEs) and selects a DOE. The selected DOE is illuminated by light from a light source and converts the light into a structured light pattern. In some embodiment, the diffractive optical units selects multiple DOEs associated with multiple structured light patterns. The structured light pattern is projected into the local area by a projection assembly of the structured light projector and illuminates the object. The depth camera assembly captures images of the object. The controller uses the captured images to determine depth information of the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.