Dynamic metering adjustment for service management of computing platform
US10467036B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 29, 2015 |
| Grant date | Nov 5, 2019 |
| Priority date | — |
| Expiry date | Dec 8, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L43/16
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods are provided for dynamic metering adjustment for service management of a computing platform. For example, a plurality of virtual machines are provisioned across a plurality of computing nodes of a computing platform. Data samples are collected for a metric that is monitored with regard to resource utilization in the computing platform by the virtual machines. The data samples are initially collected at a predefined sampling frequency. The data samples collected over time for the metric are analyzed to determine an amount of deviation in values of the collected data samples. A new sampling frequency is determined for collecting data samples for the metric based on the determined amount of deviation. The new sampling frequency is applied to collect data samples for the metric, wherein the new sampling frequency is less than the predefined sampling frequency.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.