Device and method for determining a relative deflection
US10473448B2 · kind B2 · utility
0Cited by
7References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 8, 2016 |
| Grant date | Nov 12, 2019 |
| Priority date | — |
| Expiry date | Dec 8, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01D5/243
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device is configured to determine a relative deflection of two transmitter elements by a sensor element. The transmitter elements are arranged at the sensor element. The deflection of the transmitter elements with respect to one another at the sensor element can be determined based on a degree of overlap of conductive regions of the transmitter elements by the sensor element.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.