Test artifact for non-destructive evaluation
US10473552B1 · kind B1 · utility
3Cited by
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20Claims
0Family size
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Key dates
| Filing date | Apr 11, 2018 |
| Grant date | Nov 12, 2019 |
| Priority date | — |
| Expiry date | Jul 26, 2038 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P10/25
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to an additively manufactured (AM), monolithic, multi-axis linear flexural cantilever test artifact. The artifact is monolithic in that is it one continuous part with no assembly. The artifact can be non-destructively evaluated and includes a support frame, cantilevers, and a mount.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.