Patent · US Active

Desaturation detection circuit and desaturation circuit monitoring function

US10473710B2 · kind B2 · utility

8Cited by
2References
20Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 29, 2015
Grant dateNov 12, 2019
Priority date
Expiry dateOct 7, 2036

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03K17/0828
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Systems, circuits, and chips for protecting transistors and circuits containing transistors are provided. As an example, a transistor (e.g., an Insulated-Gate Bipolar Transistor (IGBT)) monitoring system is disclosed to include an IGBT desaturation detection circuit that is configured to check and monitor desaturation functionality of the IGBT before startup of the IGBT as well as during operation of the IGBT.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.