Method and apparatus for detecting a force
US10474273B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 3, 2017 |
| Grant date | Nov 12, 2019 |
| Priority date | — |
| Expiry date | Dec 22, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2203/04105
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present disclosure provide a method for detecting a force, including: acquiring a plurality of sample data of a first electronic device, where each of the plurality of sample data includes a preset force and raw data of the first electronic device, and the raw data of the first electronic device is obtained by detecting a deformation signal generated by the preset force applied to an input medium of the first electronic device; and determining a fitting function according to the plurality of sample data of the first electronic device, where the fitting function denotes a corresponding relationship between a force applied to the input medium of the first electronic device and detected raw data, and the fitting function is used for a second electronic device to determine a force corresponding to raw data detected when an input medium of the second electronic device is subjected to an acting force.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.