Measurement device and measurement method
US10478063B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 14, 2014 |
| Grant date | Nov 19, 2019 |
| Priority date | — |
| Expiry date | May 29, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30201
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An eyeblink measurement system 10 is a measurement apparatus for measuring a subject's eyelid position, and includes a lighting device 1 that irradiates light extending across upper to lower eyelids of the subject's eye region E, and an image measurement device 2 that has an optical axis Ia on a plane for which a plane including an irradiation optical axis La of the light is rotated by a predetermined angle θ around an axis A1 along the light to be irradiated onto the subject, obtains height information based on the position of an optical image of the light in an image imaged, and measures the eyelid position based on the height information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.