Inspecting a slab of material
US10480925B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 15, 2018 |
| Grant date | Nov 19, 2019 |
| Priority date | — |
| Expiry date | Nov 15, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/8841
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for inspecting a slab of material may include an optical fiber, a broadband light source configured to emit light having wavelengths of 780-1800 nanometers over the optical fiber, a beam-forming assembly configured to receive the light over the optical fiber and direct the light toward a slab of material, the beam-forming assembly may be configured to maintain the position of one or more elements within the beam-forming assembly despite changes in environmental temperature; a computer-controlled etalon filter configured to receive the light over the optical fiber, filter the light, and direct the light over the optical fiber; and a computer-controlled spectrometer configured to receive the light over the optical fiber after the light has been filtered by the etalon filter and after the light has been reflected from or transmitted through the slab of material and spectrally analyze the light.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.