X-ray backscatter inspection system
US10481113B2 · kind B2 · utility
5Cited by
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20Claims
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Key dates
| Filing date | May 22, 2017 |
| Grant date | Nov 19, 2019 |
| Priority date | — |
| Expiry date | Feb 23, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/053
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus and methods for Compton scattering radiography employing a variable energy X-ray source and a detector capable of detecting the temporal intensity profile of scattered X-ray pulses disposed on one side of an object to be imaged. Based on analysis of the measurement of the instantaneous intensity of the detected photons and the beam position relative to the object, an image is generated. Each voxel can be reconstructed to yield a measure of variation in the density of the material of the object.
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