High resolution inspection device for casting defects using IR imaging
US10481116B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Aug 7, 2015 |
| Grant date | Nov 19, 2019 |
| Priority date | — |
| Expiry date | Mar 21, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N21/42221
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A nondestructive system and method for high resolution thermal imaging in metal casting applications is provided to detect defects and starts with the article under test being subjected to a thermal gradient, followed by infrared images taken thereof. The creation of the thermal gradient results in any defects reacting differently to the thermal gradient application to accentuate the defect in the infrared image. The apparatus for conducting the tests in one embodiment includes a single channel sensor, remote cable, and a laptop controller with real time image processing software. This hardware provides high resolution, real-time viewable infrared (IR) images with a variable focus distance adjustable from six inches to infinity. The apparatus enables crisp, clear imagery of various metal casting defects.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.