Patent · US Active

System and method for monitoring manufacturing

US10481597B2 · kind B2 · utility

14Cited by
1References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 8, 2016
Grant dateNov 19, 2019
Priority date
Expiry dateAug 4, 2037

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P90/80
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

A system for monitoring manufacturing includes one or more sensors and a controller in communication with the one or more sensors. The controller may include one or more processors that determine a quality metric represented by machine data collected from one or more machine data sensors and identify a correlation value between the machine data and environmental data collected from one or more environmental data sensors. The controller may further include determine if the correlation value exceeds a predetermined threshold value, and if the correlation value exceeds the predetermined threshold value, report at least one of the correlation value and the quality metric.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.