Multi-layer test suite generation
US10482002B2 · kind B2 · utility
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15References
20Claims
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Key dates
| Filing date | Sep 20, 2018 |
| Grant date | Nov 19, 2019 |
| Priority date | — |
| Expiry date | Sep 20, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3692
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method for developing a multi-layered test suite for an operating platform including a framework layer and a system layer includes executing a first test suite against a version of the operating platform modified based on a software faults. A first counter is incremented if a first test suite executed against the modified version of the operating platform fails. A second test suite can be executed against the modified version of the operating platform and test cases may be added to the first test suite based on whether the second test suite passes or fails.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.