Method for analyzing a structured document likely to be deformed
US10482324B2 · kind B2 · utility
0Cited by
6References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 29, 2018 |
| Grant date | Nov 19, 2019 |
| Priority date | — |
| Expiry date | May 22, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/16
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The invention relates to a method for analyzing a structured document likely to be deformed from a first image and a second image of the document, comprising steps of:
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.