Systems and methods for reducing manufacturing failure rates
US10482382B2 · kind B2 · utility
1Cited by
43References
17Claims
0Family size
Assignee
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Key dates
| Filing date | May 9, 2017 |
| Grant date | Nov 19, 2019 |
| Priority date | — |
| Expiry date | May 9, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q10/06
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods are provided for reducing failure rates of a manufactured products. Manufactured products may be clustered together according to similarities in their production data. Manufactured product clusters may be analyzed to determine mechanisms for failure rate reduction, including adjustments to test quality parameters, product formulas, and product processes. Recommended product adjustments may be provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.