Method and system for testing beam forming capabilities of wireless devices
US10484110B2 · kind B2 · utility
0Cited by
18References
8Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 16, 2019 |
| Grant date | Nov 19, 2019 |
| Priority date | — |
| Expiry date | May 16, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B7/0617
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In some embodiments, a positioning system is configured to position a plurality of antennas about a device under test (DUT). According to one embodiment, a positioning system includes a first positioner configured to hold a DUT and to provide motion of the DUT about a first axis, and a second positioner configured to hold a first antenna and to provide motion of the first antenna about a second axis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.