Method and system for measuring a propagation delay and transmittance of a device under test (DUT)
US10488463B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 15, 2017 |
| Grant date | Nov 26, 2019 |
| Priority date | — |
| Expiry date | May 31, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/58
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention provides a method and system for measuring a propagation delay of a device under test (DUT) using a first measurement unit and a second measurement unit. A first periodic signal transmitted from the first measurement unit via the DUT is received at the second measurement unit as a first delayed periodic signal. The first delayed periodic signal is then compared with a second periodic signal at the second measurement unit to generate the second comparison phase output. Similarly, the second periodic signal transmitted from the second measurement unit via the DUT is received at the first measurement unit as a second delayed periodic signal. The second delayed periodic signal is then compared with the first periodic signal at the first measurement unit to generate the first comparison phase output. Thereafter, the propagation delay is calculated by combining the first comparison phase output and the second comparison phase output.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.