Analysis method of embedded system dysfunctions, associated computer program product and analysis device
US10489235B2 · kind B2 · utility
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Key dates
| Filing date | Sep 4, 2017 |
| Grant date | Nov 26, 2019 |
| Priority date | — |
| Expiry date | Apr 13, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N5/022
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for analyzing dysfunctions of an embedded system including a phase for modeling this system and an analysis phase, the modeling phase including defining a set of resources, a set of services, a set of statuses and at least one rule for the acquisition of a status by a resource or by a service, the analysis phase including configuring the analysis including marking a marked event and analyzing acquisition rules to determine a set of basic events and conditions for the appearance thereof, leading to the appearance of the marked basic event.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.