Patent · US Active

Application testing

US10489282B2 · kind B2 · utility

1Cited by
3References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 30, 2015
Grant dateNov 26, 2019
Priority date
Expiry dateApr 30, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F9/44
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Examples disclosed herein relate to application testing. The examples may enable identifying a set of tests for testing an application and identifying a set of attributes associated with a particular test of the set of tests. The set of attributes may comprise an average execution duration of the particular test, a last execution time of the particular test, and a last execution status of the particular test. The examples may further enable determining attribute scores associated with individual attributes of the set of attributes and obtaining user-defined weights associated with the individual attributes. The examples may further enable determining a test score associated with the particular test based on the attribute scores and the user-defined weights associated with the individual attributes. The set of tests may be sorted based on the test score associated with the particular test. The sorted set of tests may be executed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.