Inspection path display
US10495454B2 · kind B2 · utility
0Cited by
7References
20Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 7, 2018 |
| Grant date | Dec 3, 2019 |
| Priority date | — |
| Expiry date | Jun 7, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N29/265
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An inspection system, in an embodiment, can be operable with a probe and a position tracker to inspect an object. The system can be operable to display at least one probe travel axis, receive first and second inspection values from the probe, associate the first inspection value with a first position point, and associate the second inspection value with a second position point. The system displays an inspection path based on the associations. The inspection path extends relative to the probe travel axis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.