Snow quality measuring apparatus and snow quality measuring method
US10495747B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 15, 2016 |
| Grant date | Dec 3, 2019 |
| Priority date | — |
| Expiry date | Nov 17, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S13/34
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A snow quality measuring apparatus according to one aspect of the present invention includes a plurality of reflectors, at least one transmitter, at least one receiver, and a measuring device. The plurality of reflectors are respectively arranged at a plurality of prescribed heights above the ground. The transmitter emits radio waves towards the plurality of reflectors, and the receiver receives the reflected waves of the radio waves from the plurality of reflectors. The measuring device measures snow quality of snow on the ground at the prescribed plurality of heights based on the respective reflected waves to from the plurality of reflectors as received by the receiver.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.